研究室紹介 表面ナノ材料評価研究室
| 教員 | ティティ レイ（客員教授） 博士(学術) | |
| 略歴 | 1986年 1995 年 1997-2003年 2003-2006年 2006-2008 2009-現在 2013-2015年 2015-2017 2017-現在 | ヤンゴン大学応用物理学専攻修士課程 卒業 |
| 受賞・表彰歴 | 1995年 | 電気学会 優秀論文発表賞受賞 |
| 担当科目 | (学部) 化学数学III(前)、化学数学IV(後)、物理化学実験(前) (大学院) 物質評価特論(後) | |
| 専門分野 | 表面科学、光計測、材料物性 | |
| 所属学会 | 応用物理学会 表面科学会 精密工学会 MRS (Material Research Society) | |
| 居室 | 214(ティティ レイ) | |
研究内容
金属酸化物材料及び強誘電体材料のナノ構造を表面分析手法のよって表面・界面の結合状態や化学性質、構造変化の評価を行い、次世代エレクトロニクス・センシング材料としての電気的・機械的性能について研究しています。
昨年度の卒業研究題目
新設研究室のため無し
最近の研究業績
- "1. Epitaxial growth of well-ordered ultra-thin Al2O3 film on NiAl (110) by a single-step oxidation"
Thi Thi Lay, M. Yoshitake and W. Song
Applied Surface Science, 239, Issue3-4, 451-457 (2005) - "Well-ordered ultra-thin Al2O3 film formation on NiAl (110) by high temperature oxidation"
Michiko Yoshitake, Thi Thi Lay and W. Song
Surface Science, 564, Issue1-3, 211-217 (2004) - "Surface Segregation of Al Substrate Metal on Zr film Surface"
Thi Thi Lay, M. Yoshitake and S. Bera
Applied Surface Science, 220, Issue1-4, 113-116 (2003) - 以下省略
最近の学会発表
- Surface and Interfacial Reaction of Al2O3/SiO2/Si films by SR-XPS
Thithi Lay, M. Imamura, N. Matsubayashi, M. Jo
5th IIRC conference "Frontier Forefront of Molecular Dynamics at Surfaces and Interfaces: From a Single Molecule to Catalytic Reaction", 83, 20-23 November (2017) Tokyo Japan. - Analysis of Interfacial Reactions in Ultra-thin Al2O3/SiO2/Si films by SR-XPS
Thithi Lay, M. Imamura, N. Matsubayashi, M. Jo2, I. Kojima, Min Min Soe, Khi Khin Win
Regional Conference on Materials Engineering (RCME 2016, AUN/SEED-Net), 21, 25-26 October (2016) - Characteristic of piezoelectric properties under high load conditions-,Part 1: Resonant-antiresonant method under high temperature conditions
Morita Takeshi, Thithi Lay, etc.
Fine ceramics, JIS R16991-1(2016) - 4. Spectroscopic Characterization of Ultra-thin Al2O3/SiO2/Si films by SR-XPS
Thi Thi LAY, Motoyasu IMAMURA, Nobuyuki MATSUBAYASHI
Material Research Society (MRS), mrss11-1351-ff05-08 (2011) - Analysis of Interfacial Reactions in Ultra-thin Al2O3/SiO2/Si films by SR-XPS
Thi Thi LAY, Motoyasu IMAMURA, Nobuyuki MATSUBAYASHI, Masatoshi JO and Isao KOJIMA
International Symposium on Surface Science (ISSS-5), 243 (2008) - Study on Surface Properties of Transition Metal Carbides by X-ray photoelectron spectroscopy
Thi Thi LAY, Natsuo FUKUMOTO, Masatoshi JO, Motoyasu IMAMURA, Nobuyuki MATSUBAYASHI, and Isao KOJIMA
European Conference on Applications of Surface and Interface Analysis (ECASIA), 301 (2007) - Study on Charge Effect of Ultra-thin Al2O3/SiO2/Si Films by XPS
Thi Thi LAY, Motoyasu IMAMURA, Nobuyuki MATSUBAYASHI, Natsuo FUKUMOTO, Masatoshi JO and Isao KOJIMA
4th International Symposium on Practical Surface Analysis (PSA07), (2007) - Chromatic dispersion measurement of SOA in C+L band by self-tracking real-time
Kensuke Ogawa and Thi Thi Lay
OFC /NFOEC2005, Anaheim CA (2005) - Broadband self-tracking fiber interferometer with 1GHz spectral resolution and 1s measurement time
Kensuke Ogawa and Thi Thi Lay
CLEO2004, San Francisco CA (2004) - 以下省略.